Application Notes: General

EP-IR Spectrometry -- a cost-effective, rugged and compact high scanning speed full-spectrum technology -- provides a means to simultaneously measure spectrally overlapping compounds without false positive response, considerably exceeding TUEV and MCERTS analytical requirements for cross sensitivity.

WITec GmbH

Biotools, Inc.

Jasco, Inc.

Stephen T. Watts, Kazuyo Miura, and Takayuki Wakui, Hitachi High Technologies America, Inc.

Gabor J. Kemeny, PIKE Technologies, Inc.

Mike Doyle, Axiom Analytical, Inc.

Betrand S. Lanher, Aspectrics, Inc.

Ralph H. Obenauf and Nimi Kocherlakota, Spex CertiPrep, Inc.

Jordan Valley AR, Inc.

Thanos Pantazis, Amptek, Inc.

Ocean Optics

Jasco, Inc.

Analytical Spectral Devices, Inc.

Hitachi High Technologies America, Inc.

Thermo Electron Corp.

Retsch, Inc.

PIKE Technologies

Jordan Valley AR, Inc.

Amptek, Inc.

WITec Instruments Corp.

B&W Tek, Inc.

Stranaska LLC

SPEX CertiPrep

PIKE Technologies

Lambda Solutions, Inc.

Princeton Instruments

Jasco, Inc.