Application Notes: General

Eunah Lee, Fran Adar, and Andrew Whitely, HORIBA Jobin Yvon, Inc.

The RoHS/WEEE directive requires the electronics industry to certify that products comply with maximum concentration amounts of particular elements and compounds (Cr VI, Pb, Cd, Hg, Br PBB/PBDE) by July 2006. Instrumentation must be developed to perform the certification.

Gabriela Zurek, Birgit Schneider, and Carsten Baessmann, Bruker Daltonik GmbH

Michael Leist, ray Leiser, and Andrew Toms, Varian, Inc.

EP-IR Spectrometry -- a cost-effective, rugged and compact high scanning speed full-spectrum technology -- provides a means to simultaneously measure spectrally overlapping compounds without false positive response, considerably exceeding TUEV and MCERTS analytical requirements for cross sensitivity.

WITec GmbH

Biotools, Inc.

Jasco, Inc.

Stephen T. Watts, Kazuyo Miura, and Takayuki Wakui, Hitachi High Technologies America, Inc.

Gabor J. Kemeny, PIKE Technologies, Inc.

Mike Doyle, Axiom Analytical, Inc.

Betrand S. Lanher, Aspectrics, Inc.

Ralph H. Obenauf and Nimi Kocherlakota, Spex CertiPrep, Inc.

L.A. Fido and A.C. Dennis, Avalon Instruments

Jordan Valley AR, Inc.

Thanos Pantazis, Amptek, Inc.

Ocean Optics

Jasco, Inc.

Analytical Spectral Devices, Inc.

Hitachi High Technologies America, Inc.

Thermo Electron Corp.

Retsch, Inc.

PIKE Technologies

Jordan Valley AR, Inc.

Amptek, Inc.

WITec Instruments Corp.

B&W Tek, Inc.

Stranaska LLC

SPEX CertiPrep

PIKE Technologies