Application Notes: Atomic Spectroscopy

Thermal Analysis Applications for Semiconductor Packaging

March 16, 2023

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Semiconductor manufacturing requires failure analysis and QC processes. Learn how Thermal Analyses applications can lead to cost savings in R&D and QA/QC.

ICP-MS Analysis of Soil and Water by EPA Method 6020B

March 16, 2023

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This work demonstrates that the NexION® 2000 ICP-MS meets the needs of analytical laboratories involved in the analysis of waters and soils.

Analyzing Iron Nanoparticles in Organic Solvents

March 16, 2023

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This work demonstrates the ability of the NexION® SP-ICP-MS to detect iron-containing nanoparticles in organic solvents using Reaction mode.

Automated Analysis of Semiconductor-Grade Hydrofluoric Acid

March 16, 2023

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This work presents the automated analysis of HNO3 using the NexION® 5000 ICP-MS working with the ESI prepFAST S ultraclean sample introduction system.

Analysis of Nanoparticles in Semiconductor Chemicals

March 16, 2023

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This work describes a method for the routine ultratrace-level quantification of nanoparticle impurities in TMAH using the NexION® 5000 Multi-Quadrupole ICP-MS.

Water Analysis Following EPA Method 200.7 by ICP-OES

March 16, 2023

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This work shows the ability of the Avio® 560 Max ICP-OES to perform rapid analysis – 60 seconds sample to sample – of wastewater in accordance with EPA Method 200.7.

Ultra-Trace Quantification of Non-Metals

March 16, 2023

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This work demonstrates the ability of the NexION® 5000 ICP-MS to determine DLs and BECs of typical non-metal contaminants in sulfuric acid solutions.

Multi-Elemental Analysis of Soils Using the NexION ICP-MS

March 16, 2023

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This work demonstrates the ability of the NexION® ICP-MS to analyze 21 elements in soil over an extended period of time with outstanding accuracy and stability.

Multi-Elemental Analysis of Soils Using the NexION ICP-MS (Mar 2023)

March 16, 2023

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This work demonstrates the ability of the NexION® ICP-MS to analyze 21 elements in soil over an extended period of time with outstanding accuracy and stability.

Automated Analysis of Semiconductor-Grade BOE

March 16, 2023

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This work presents the automated analysis of undiluted HF using PerkinElmer’s NexION® 5000 ICP-MS working with ESI’s prepFAST S ultraclean sample introduction system.