Application Notes: Atomic Spectroscopy
USP Regulations for Heavy Metal Testing
Guidance on selecting the optimum microwave technology for the unique demands of pharmaceutical and nutraceutical matrices, as outlined in USP Chapter <233>.
Analyzing Key Elements in Potable Water
This work focuses on the analysis of potable waters at required levels using the Avio® 220 Max hybrid simultaneous ICP-OES.
Vitesse TOF-ICP-MS: Live High-Speed Multi-Elemental Imaging
This application note describes how Vitesse TOF-ICP-MS can produce high speed multi-elemental images by reducing large amounts of data to individual pixels.
Efficient Sample Prep for Lithium-Ion Batteries
This application note demonstrates CEM’s BLADE, an automated digestion system capable of efficiently analyzing source materials of batteries for improved production.
Analyzing Blood Using NexION 5000 ICP-MS
This work demonstrates the ability of the NexION® 5000 ICP-MS to perform reproducible analyses of blood samples with excellent stability over long sample run times.
Metallic Impurities in Silicon Wafers
This work demonstrates the coupling of an IAS Expert_PS VPD system with the NexION® 5000 Multi-Quadrupole ICP-MS for determination of metallic impurities in Si wafers.
Determination of Lithium Material Impurities
This application note demonstrates the ability of the NexION® 5000 ICP-MS to achieve outstanding detection limits for the analysis of Li salts.
NexION 5000 Multi-Quadrupole ICP-MS
This application digest offers a selection of application spotlights across different market segments with the opportunity to download the full application notes.
Impurity Measurement in High-Purity Copper Concentrate
This work demonstrates the accurate and reliable quantification of impurities in Cu concentrate using the NexION® 5000 ICP-MS.
Analyzing Cement-Pressed Pellets Via XRF
XRF is a key quality control technique for cement production. We look at results from two types of portland cement prepared as pressed pellets.
2D Material Characterization Using Nanoscale Spectroscopy
AFM-IR analyzes nanoscale chemical and complex optical properties of 2D materials, including graphene, hexagonal boron nitride, nanoantennae, and semiconductors.
Characterization of Advanced Semiconductor Materials
Nanoscale IR spectroscopy combines AFM and IR techniques to enable nanoscale chemical identification of semiconductor materials, specifically those that are organic.
High-Resolution Chemical Imaging with Tapping AFM-IR
Tapping AFM-IR combines IR spectroscopy and AFM topography mapping to overcome traditional resolution and sample-type limitations to a host of new applications.
Characterize Biological Samples in Nanoscale Detail
Principles of AFM-IR and its application in life sciences, including nanoscale characterization of proteins, structures within single cells, monolayers, and tissues.
Chemical Characterization of Polymeric Films
Photothermal AFM-IR uniquely provides correlated nanoscale chemical and material property characterization for a wide range of polymeric and thin film samples.
Nanoscale and Bulk Thermal Analysis
NanoTA is a localized thermal analysis technique that combines the high spatial resolution imaging of AFM with the ability to study thermal behavior of materials.
Spatiospectral Nanoimaging of Surface Phonon Plasmons (Sept 2023)
Combining imaging with broadband spectroscopy provides spatiospectral nanoimaging of 2D materials with nanometer spatial resolution and wide spectral coverage.
Analysis of Macronutrients in Pet Food
This work demonstrates a method for the analysis of a variety of pet food samples by ICP-OES, with the benefits of low argon consumption and rapid analysis times.
Selecting the Right Microwave Digestion System
This article highlights key considerations, innovations, applications, and guidelines in microwave digestion for optimized sample preparation quality and efficiency.
Determination of Nickel-Based Superalloy Trace Elements
This work demonstrates the ability of the NexION® 2000 ICP-MS to accurately and directly measure 16 trace elements in a nickel-based superalloy matrix.
Analysis of Elements in Plant-Based Foods
This work presents a reliable method for analyzing elements in plant-based foods to inform formulation, nutritional labeling, and prevent metal contamination.
Determination of Toxic and Other Trace Elements in Baby Foods
This application note describes a procedure for the analysis of toxic elements (As, Cd, Hg, and Pb) and other trace elements in baby foods following FDA EAM 4.7.
Toxic Trace Metals in Edible Oils
This method reports the development of a direct analysis method for toxic metals in edible oil samples using GFAAS without digestion.
Determination of Cassava Flour Heavy Metals
This work describes a procedure for the accurate quantification of heavy metals in cassava flours following U.S. FDA’s EAM 4.7 using PerkinElmer’s NexION® ICP-MS.
Analyzing Fruit Juice Micronutrients by ICP-OES
This work focuses on the analysis of micronutrients in a variety of commercial juice products using the Avio® 220 Max hybrid simultaneous ICP-OES.
Characterizing Arsenic Species in Apple Juice
This work demonstrates a reversed-phase ion-pairing method for the complete separation and accurate quantification of relevant arsenic species.
Trace Contaminants in High-Purity Silicon Matrices
Silicon sample analysis using ICP-MS, focusing on elements suffering from spectral interferences, from polyatomic ions formed by Si, diluent acids and plasma gases.
Ultrapure Water to Assess Toxic Elements
This study demonstrates the suitability of freshly prepared ultrapure water for ICP-MS trace element analyses in environmental laboratories
Characterization of Nanoparticle Element Oxide Slurries
This study outlines the quantitation and characterization of element oxide nanoparticles (Al2O3, and CeO2) in nanoelectronics and semiconductors.
Thermal Analysis Applications for Semiconductor Packaging
Semiconductor manufacturing requires failure analysis and QC processes. Learn how Thermal Analyses applications can lead to cost savings in R&D and QA/QC.