The Optima 8x00 ICP-OES series utilizes the new Flat Plate plasma technology that replaces the traditional helical coil design used since the inception of the inductively coupled plasma. The Flat Plate plasma technology, as seen in Figure 1, utilizes two flat induction plates to produce a plasma that is compact, dense, and robust. This plasma utilizes about half the argon required by previous helical coil designs while still delivering exceptional analytical performance.
In this study, apple juice samples are analyzed by IC–ICP–MS to determine the concentration of six arsenic species: the two inorganic, and highly toxic, species (As (V) and As [III]) and four organic species (arsenobetaine [AsB], arsenocholine [AsC], monomethylarsonic acid [MMA], and dimethylarsinic acid [DMA]).
Current USP Method 231 "Heavy Metals" was introduced in 1905 for determining heavy metal impurities in pharmaceutical drug products. The procedures of the method have several limitations, which produce results that are nondiscriminatory, difficult to reproduce, and qualitative, or at best, semi-quantitative.
Building on more than 10 years of Micro-XRF experience, the Orbis spectrometer yields a system with excellent Micro-XRF capability while setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret integrating video and X-ray optics allowing coaxial sample view and X-ray analysis. The turret can accommodate two additional collimators along with the X-ray optic for a total of three X-ray beam sizes to expand the Orbis analytical capabilities beyond traditional Micro-XRF analysis. Primary beam filters can be used with all spot sizes available on the turret to allow true XRF analytical capabilities in a micro-spot analysis. The working distance is increased to allow analysis over rougher sample topography without sacrificing signal intensity.
Atomic absorption (AA) is a mature technique, but many laboratories are still finding room for innovation and continued success with it. Joining us for this discussion are Charles A. Schneider, PerkinElmer, Inc., and Fergus Keenan, Thermo Fisher Scientific.
The formal European Union analytical method to measure and regulate the concentration of selenium disulphide is by the determination of selenium via flame atomic absorption spectrometry.
Building on more than 10 years of Micro-XRF experience, the Orbis spectrometer yields a system with excellent Micro-XRF capability while setting a new standard in analytical flexibility.
The measurement of the elemental composition of suspended particulate matter (SPM) in air is a key factor in understanding the health effects of pollution.
One of the most common product safety-related analytical tests in the pharmaceutical industry (often referred to as a Limit Test) is the quantification of heavy metals or inorganics in all materials within a pharmaceutical product.
This application note demonstrates the analysis of lead, cadmium, mercury, chromium, and bromine in polymers, compliant to ASTM F2617-08. The TOXEL and RoHS Calibration Standards were used to set up the calibration on Epsilon 5. The accuracy of the calibration is demonstrated by determination of European Reference Material (ERM) EC681k.
The analysis of toy samples for toxic trace elements has been undertaken for many years. However, a number of recent cases of toys contaminated with heavy metals has attracted global media attention. This has resulted in an increase in the number of toy manufacturers performing their own 'in-house' testing. This 'in-house' testing is not only to ensure regulatory compliance; it is also proving significantly more cost effective than outsourcing the analysis.
Global warming is seen as a growing problem across the world. One of the major contributing factors to global warming is greenhouse gas emissions and particulates emitted from automobiles. In an attempt to control the particulate emissions from motor vehicles, limits have been placed on the amount of elements such as Sulfur allowed in automotive fuels. Currently in the US, the EPA tier 2 regulations have set the limit for S in road fuels (Gasoline, Diesel and Biodiesel) at 150 ppm.
A method for the determination of elemental impurities in solid silver samples was developed using a spark ablation accessory in combination with ICP-OES. Detection limits at the sub-ppm level were achieved along with good accuracy and precision.
It is shown that the Retsch CryoMill polymers are ground to a significantly smaller fineness compared to other methods. Especially for inhomogeneous materials, small particles are the key for a high reproducibility.
Building on more than 10 years of Micro-XRF experience, the Orbis spectrometer yields a system with excellent Micro-XRF capability while setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret integrating video and X-ray optics allowing coaxial sample view and X-ray analysis. The turret can accommodate two additional collimators along with the X-ray optic for a total of three X-ray beam sizes to expand the Orbis analytical capabilities beyond traditional Micro-XRF analysis. Primary beam filters can be used with all spot sizes available on the turret to allow true XRF analytical capabilities in a micro-spot analysis. The working distance is increased to allow analysis over rougher sample topography without sacrificing signal intensity.
Wavelength-Scanned Cavity Ring Down Spectroscopy combines the real-time speed and turnkey simplicity of optical spectroscopy with the precision (<0.1 δ18O [‰], < 0.5 δD [‰]) previously only available from complex IRMS systems.
The factors that affect the long-term stability of ICP instruments are discussed and details of the performance of the Thermo Scientific iCAP 6000 Series for extended period analyses are given.
The availability of new silicon drift detectors (SDD) allows for more precise measurements in less acquisition time. SDDs are often praised for their excellent energy resolution, but it is their increased throughput that make them ideal for many industrial applications. Due to the detector's smaller capacitance, a much shorter peaking time is used in the shaping amplifier without sacrificing resolution. This dramatically increases the throughput of the system. Compared with a conventional Si-PIN detector where the peaking time is as long as 25 ms, the drift detector operates at 1.6 ms, thereby increasing throughput from 10,000 counts per second to over 100,000. This advantage can be used in two primary ways.
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