Application Notes: Atomic Spectroscopy
Automated Analysis of Semiconductor-Grade Hydrofluoric Acid
This work presents the automated analysis of HNO3 using the NexION® 5000 ICP-MS working with the ESI prepFAST S ultraclean sample introduction system.
Analysis of Nanoparticles in Semiconductor Chemicals
This work describes a method for the routine ultratrace-level quantification of nanoparticle impurities in TMAH using the NexION® 5000 Multi-Quadrupole ICP-MS.
Water Analysis Following EPA Method 200.7 by ICP-OES
This work shows the ability of the Avio® 560 Max ICP-OES to perform rapid analysis – 60 seconds sample to sample – of wastewater in accordance with EPA Method 200.7.
Ultra-Trace Quantification of Non-Metals
This work demonstrates the ability of the NexION® 5000 ICP-MS to determine DLs and BECs of typical non-metal contaminants in sulfuric acid solutions.
Multi-Elemental Analysis of Soils Using the NexION ICP-MS
This work demonstrates the ability of the NexION® ICP-MS to analyze 21 elements in soil over an extended period of time with outstanding accuracy and stability.
Multi-Elemental Analysis of Soils Using the NexION ICP-MS (Mar 2023)
Automated Analysis of Semiconductor-Grade BOE
This work presents the automated analysis of undiluted HF using PerkinElmer’s NexION® 5000 ICP-MS working with ESI’s prepFAST S ultraclean sample introduction system.
Optimizing Conditions of Resins and Composites
This application note studies the cure kinetics of epoxy resin, known for its strong adhesive qualities. This makes it a versatile product in many industries.
Trace Metals in Water by GFAAS
This work shows the accuracy of the PinAAcle™ 900T, with a unique optical system, for the use of EPA Method 200.9 for As, Cd, Pb, Se, and Tl in drinking waters.
Unlocking Carbon-13 with SP-ICP-MS for Microplastics Detection
This work describes the capability of SP-ICP-MS for the detection of microplastics, using the NexION® ICP-MS with Syngistix™ Nano Application software module.