Application Notes: Atomic Spectroscopy

This application note demonstrates the ability of the NexION® 5000 ICP-MS to achieve outstanding detection limits for the analysis of Li salts.

This application digest offers a selection of application spotlights across different market segments with the opportunity to download the full application notes.

This work demonstrates the accurate and reliable quantification of impurities in Cu concentrate using the NexION® 5000 ICP-MS.

XRF is a key quality control technique for cement production. We look at results from two types of portland cement prepared as pressed pellets.

AFM-IR analyzes nanoscale chemical and complex optical properties of 2D materials, including graphene, hexagonal boron nitride, nanoantennae, and semiconductors.

Nanoscale IR spectroscopy combines AFM and IR techniques to enable nanoscale chemical identification of semiconductor materials, specifically those that are organic.

Tapping AFM-IR combines IR spectroscopy and AFM topography mapping to overcome traditional resolution and sample-type limitations to a host of new applications.

Principles of AFM-IR and its application in life sciences, including nanoscale characterization of proteins, structures within single cells, monolayers, and tissues.

Photothermal AFM-IR uniquely provides correlated nanoscale chemical and material property characterization for a wide range of polymeric and thin film samples.

NanoTA is a localized thermal analysis technique that combines the high spatial resolution imaging of AFM with the ability to study thermal behavior of materials.

Combining imaging with broadband spectroscopy provides spatiospectral nanoimaging of 2D materials with nanometer spatial resolution and wide spectral coverage.

This work demonstrates a method for the analysis of a variety of pet food samples by ICP-OES, with the benefits of low argon consumption and rapid analysis times.

This article highlights key considerations, innovations, applications, and guidelines in microwave digestion for optimized sample preparation quality and efficiency.

This work demonstrates the ability of the NexION® 2000 ICP-MS to accurately and directly measure 16 trace elements in a nickel-based superalloy matrix.

This work presents a reliable method for analyzing elements in plant-based foods to inform formulation, nutritional labeling, and prevent metal contamination.

This application note describes a procedure for the analysis of toxic elements (As, Cd, Hg, and Pb) and other trace elements in baby foods following FDA EAM 4.7.

This method reports the development of a direct analysis method for toxic metals in edible oil samples using GFAAS without digestion.

This work describes a procedure for the accurate quantification of heavy metals in cassava flours following U.S. FDA’s EAM 4.7 using PerkinElmer’s NexION® ICP-MS.

This work focuses on the analysis of micronutrients in a variety of commercial juice products using the Avio® 220 Max hybrid simultaneous ICP-OES.

This work demonstrates a reversed-phase ion-pairing method for the complete separation and accurate quantification of relevant arsenic species.

Silicon sample analysis using ICP-MS, focusing on elements suffering from spectral interferences, from polyatomic ions formed by Si, diluent acids and plasma gases.

This study demonstrates the suitability of freshly prepared ultrapure water for ICP-MS trace element analyses in environmental laboratories

This study outlines the quantitation and characterization of element oxide nanoparticles (Al2O3, and CeO2) in nanoelectronics and semiconductors.

Semiconductor manufacturing requires failure analysis and QC processes. Learn how Thermal Analyses applications can lead to cost savings in R&D and QA/QC.

This work demonstrates that the NexION® 2000 ICP-MS meets the needs of analytical laboratories involved in the analysis of waters and soils.

This work demonstrates the ability of the NexION® SP-ICP-MS to detect iron-containing nanoparticles in organic solvents using Reaction mode.

This work presents the automated analysis of HNO3 using the NexION® 5000 ICP-MS working with the ESI prepFAST S ultraclean sample introduction system.

This work describes a method for the routine ultratrace-level quantification of nanoparticle impurities in TMAH using the NexION® 5000 Multi-Quadrupole ICP-MS.

This work shows the ability of the Avio® 560 Max ICP-OES to perform rapid analysis – 60 seconds sample to sample – of wastewater in accordance with EPA Method 200.7.

This work demonstrates the ability of the NexION® 5000 ICP-MS to determine DLs and BECs of typical non-metal contaminants in sulfuric acid solutions.