Application Notes: Atomic Spectroscopy

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This work demonstrates the coupling of an IAS Expert_PS VPD system with the NexION® 5000 Multi-Quadrupole ICP-MS for determination of metallic impurities in Si wafers.

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This application digest offers a selection of application spotlights across different market segments with the opportunity to download the full application notes.

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NanoTA is a localized thermal analysis technique that combines the high spatial resolution imaging of AFM with the ability to study thermal behavior of materials.

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This work demonstrates a method for the analysis of a variety of pet food samples by ICP-OES, with the benefits of low argon consumption and rapid analysis times.