Robert Thomas

Robert Thomas has more than 30 years of experience in trace element analysis. He is the principal of his own freelance writing and scientific consulting company, Scientific Solutions, based in Gaithersburg, MD.

Articles by Robert Thomas

This installment describes the development of two novel X-ray diffraction (XRD) techniques that enable the rapid analysis of samples using handheld instrumentation for remote applications. Both techniques can be applied to unprepared samples in the field, which is a highly favorable characteristic in many applications since the time required for laboratory-based sample preparation is avoided.

This study investigates the applicability of a quadrupole-based ICP-MS fitted with a dynamic reaction cell (DRC) to analyze high-purity phosphoric and sulfuric acid used in the semiconductor industry. It compares the DRC approach with traditional ICP-MS background reduction techniques to compensate for phosphorus- and sulfur-based interferences and presents data that suggests that the DRC technology can reach the next generation of semiconductor purity levels for these chemicals.