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William F. Meggers

William F. Meggers: The Dean of American Spectroscopists

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William Frederick Meggers, honored as the Dean of American Spectroscopists by the US National Bureau of Standards (NBS), dedicated over five decades of his career to NBS, which later became the US National Institute of Standards and Technology (NIST) in 1988 under the United States Department of Commerce. We profile his contributions to spectroscopy here.

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In this article, tunable diode laser absorption spectroscopy (TDLAS) is used to measure ammonia leakage, where a new denoising method combining empirical mode decomposition with the Savitzky-Golay smoothing algorithm (EMD-SG) is proposed to improve the signal-to-noise ratio (SNR) of absorbance signals.