Infrared (IR) Spectroscopy

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Application Notebook

Fourier transform infrared (FT-IR) spectrometers provide spectra in less time than scanning systems, but water vapor and/or CO2 in the sample chamber leads to additional peaks that may obscure important information. These interferences can be eliminated by sealing the sample chamber and purging with dry, CO2 free air (purge gas) or nitrogen for a short period of time.

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Application Notebook

Fat and other nutritional values can easily be determined by NIR analysis. However a proper sample preparation beforehand is essential for a correct result.

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Application Notebook

The application of FT-IR spectroscopy in quality assurance and quality control has largely been limited to laboratory efforts - bringing the samples to the instrument located on a benchtop in a lab. The advent of handheld analyzers such as A2 Technologies' Exoscan system, enables FT-IR to move from the lab to analyses at the sample site.

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Application Notebook

Near-infrared spectroscopy (NIRS) is a powerful technique for rapid and nondestructive material analysis. Scientific breakthroughs over the past several decades have made NIRS one of the most powerful tools for research, especially in industries such as food and drug, chemical, oil and gas, and plastics. This technique has mainly been limited to nonportable applications due to instrument size, fragility, and cost.

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Application Notebook

Infrared analysis of seized drugs is underutilized in many forensic laboratories owing to the ambiguous results produced by samples containing a mixture of compounds. The use of a patented multi-component search algorithm can help overcome the limitations of infrared for the identification of drugs in mixture samples.

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True Surface Microscopy

Application Notebook

Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods. However, high confocality always results in a high focus sensitivity and this can make measurements difficult with rough or inclined samples.

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Special Issues

Fourier transform–infrared (FT-IR) spectroscopy is convenient and effective for the analysis of foreign matter and other defect analysis. It is widely used to confirm, identify, and detect matter in many applications, including raw materials, medical products, packaging, and coatings.

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Special Issues

Infrared (IR) spectroscopy is one of the most versatile and powerful analytical tools that we have today for the characterization and identification of materials. Its strength lies in its ability to handle a broad range of material types, in any physical state, at a wide range of concentrations, and on many occasions, with direct methods of measurement. These strengths are about to be enhanced by the use of instrumentation that utilizes a choice of broadly tunable laser devices, covering the sweet spot of the mid-IR spectrum, the "fingerprint region." These systems currently cover the spectral range of 6–12 ?m (1665–830 cm-1), which provides spectroscopic access to almost all classes of chemical compounds. This article reviews the benefits offered by such a laser system for a wide range of new and challenging applications.

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Special Issues

Relying primarily on transmission or reflection techniques, FT-IR microscope and imaging systems often can require tedious sample preparation to obtain representative data from a sample. Conversely, similar to a sample compartment attenuated total reflectance (ATR) accessory, the ATR microscope objective requires no sample preparation as the sample can simply be contacted with the ATR element, or crystal, and then the sample spectra can be collected using the microscope detector. The ATR objectives discussed here are designed to offer simultaneous video observation of the selected sample area during infrared data collection. These ATR objectives provide a unique capability for sample observation and infrared data collection when utilizing a software mapping feature offered with the FT-IR microscopes discussed.