Application Notes: General

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Even though no current electronics is fast enough to measure femtosecond lasers, an estimation of the pulse duration, peak wavelength, and relative intensity is possible.

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Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods.

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Moxtek's ULTRA-LITE X-ray source is a very small self contained X-ray source (X-ray tube and high voltage power supply) for use in portable X-ray applications, such as the handheld X-ray fluorescence (XRF) spectrometers. This note demonstrates that this X-ray source has a stable and repeatable X-ray flux output over time, which is vital for the precision of the calibrated XRF measurements.

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The measurement of trace elements is important across a wide variety of materials characterization problems. When measuring small glass fragments collected from crime and accident scenes, forensics experts analyze trace strontium (Sr) and zirconium (Zr) typically unintentionally incorporated into the glass during manufacturing as one point of identification or comparison.

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Moxtek's ULTRA-LITE X-ray source is a very small self contained X-ray source (X-ray tube and high voltage power supply) for use in portable X-ray applications, such as the handheld X-ray florescence (XRF) spectrometers. This note demonstrates that this X-ray source has a stable and repeatable X-ray flux output over time, which is vital for the precision of the calibrated XRF measurements.

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Building on more than 10 years of Micro-XRF experience, the Orbis spectrometer yields a system with excellent Micro-XRF capability while setting a new standard in analytical flexibility. The Orbis incorporates a unique motorized turret integrating video and X-ray optics allowing coaxial sample view and X-ray analysis. The turret can accommodate two additional collimators along with the X-ray optic for a total of three X-ray beam sizes to expand the Orbis analytical capabilities beyond traditional Micro-XRF analysis.

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Identifying contaminants in materials is a common troubleshooting need for which FT-IR spectroscopy is ideally suited. Thermo Scientific OMNIC Specta software provides a unique and powerful tool to assist the analyst to quickly identify unexpected constituents. The OMNIC? Specta? Contaminant Search feature allows for rapid investigations that can save time and minimize the impact of product issues.

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Near-infrared spectroscopy (NIR) is a powerful technique for rapid and non-destructive material analysis. Scientific breakthroughs over the past several decades have made NIR one of the most powerful tools for research, especially in industries such as food and drug, chemical, oil and gas, and plastics. This technique has mainly been limited to non-portable applications due to instrument size, fragility, and cost. Additionally, Database Search Software or Multivariate Prediction Software must also be employed to extract results; however, user-friendly and cost effective solutions have not been widely available.