Application Notes: General

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Raman spectroscopy is an excellent technique for the identification and characterization of fuels. With no requirement for sample preparation and the power to identify and quantify materials, Raman has many uses across a range of industries.

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Even though no current electronics is fast enough to measure femtosecond lasers, an estimation of the pulse duration, peak wavelength, and relative intensity is possible.

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Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods.

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Moxtek's ULTRA-LITE X-ray source is a very small self contained X-ray source (X-ray tube and high voltage power supply) for use in portable X-ray applications, such as the handheld X-ray fluorescence (XRF) spectrometers. This note demonstrates that this X-ray source has a stable and repeatable X-ray flux output over time, which is vital for the precision of the calibrated XRF measurements.

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The measurement of trace elements is important across a wide variety of materials characterization problems. When measuring small glass fragments collected from crime and accident scenes, forensics experts analyze trace strontium (Sr) and zirconium (Zr) typically unintentionally incorporated into the glass during manufacturing as one point of identification or comparison.