Mass Spectrometry

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Spectroscopy

This study investigates the applicability of a quadrupole-based ICP-MS fitted with a dynamic reaction cell (DRC) to analyze high-purity phosphoric and sulfuric acid used in the semiconductor industry. It compares the DRC approach with traditional ICP-MS background reduction techniques to compensate for phosphorus- and sulfur-based interferences and presents data that suggests that the DRC technology can reach the next generation of semiconductor purity levels for these chemicals.

Spectroscopy

There is far more matter than antimatter in our universe, but scientists don?t know enough about the properties of antimatter to understand why. By spectroscopically analyzing atoms created when antiprotons collide with helium, physicists at CERN are measuring the properties of antimatter with unprecedented accuracy.

2002 Editorial Index.pdf

Spectroscopy

An index of articles and authors appearing in Spectroscopy's 2002 issues.

Spectroscopy

The need for reference materials that can be applied in the area of thin films analysis has long been realized but is still, in general, under-addressed. Alumina films of single-micrometer thickness, having either fine distributions of impurities or delta function impurity marker layers, can be prepared routinely by anodic oxidation of electropolished aluminum specimens in appropriate electrolytes. Selected films were examined by transmission electron microscopy (TEM) and analyzed by radio frequency glow discharge optical emission spectroscopy (rf-GD-OES), providing very rapid, yet high-resolution, depth-resolved analysis of these electrically insulating materials.

Spectroscopy

The authors review the science and technology of the latest generation of hand-held x-ray spectrometers and their analytical capabilities in alloy analysis.