All Videos

This explainer video highlights how spectroscopy is being integrated with artificial intelligence to improve detection accuracy of microplastics.

Why polyethylene’s IR spectrum splits—unveiling crystallinity, side chains, and polymer structure in HDPE, LDPE, and LLDPE.

Spectroscopy is increasingly being used in cultural heritage studies. We discuss spectroscopy's evolution in this field.

In this interview segment, Robert Ewing discusses how his contactless method improves on traditional drug detection techniques and how the VaporID technology remains adaptive to emerging synthetic variants.

Top articles published this week include an interview series with Robert Ewing of the Pacific Northwest National Laboratory, a news article on using infrared (IR) cameras to see invisible methane leaks, and an article about the role of vibrational spectroscopy in analyzing plant-based food products.

In Part II of our three-part interview with Robert Ewing, he reviews the results of the Nogales border test.

Experts explore the evolving role of CDMOs in semiconductor fabrication and why strategic partnerships are increasingly critical for process innovation and cost control.

Looking ahead, panelists discuss emerging technologies, new analytical frontiers, and future regulatory pressures shaping semiconductor manufacturing over the next decade.

The panel takes a deep dive into total chemical and gas management (TCGM) strategies, and the growing need for online, real-time monitoring to protect yield and safety.

Panelists discuss cutting-edge advances in monitoring ultra-pure water (UPW) purity, from ICP-MS to online pre-concentration, and the growing push for sub-ppt-level contaminant detection.

The panelists discuss the vital role of ultra-pure water (UPW) and recycled water strategies to support yield, safety, and environmental compliance.

The panel discusses how silicon (Si), silicon carbide (SiC), and gallium nitride (GaN) materials influence semiconductor design choices, yield challenges, and supply chain risks.

This episode takes a look at the evolving regulatory environment in semiconductor manufacturing, including stricter contamination standards and the challenges of global compliance.

The panelists consider non-destructive wafer analysis using TXRF and complementary methods, and how combining techniques enables advanced defect and contamination mapping.

In this episode, the panel focuses on automation in semiconductor analysis, including sample prep innovations and the unique capabilities of next-generation ICP-MS systems.

The panel compares traditional ATD-GC-MS methods to emerging TOF-MS approaches for impurity and defect analysis, emphasizing speed and sensitivity advancements.

The panelists discuss the different techniques used for testing semiconductor materials—such as ICP-MS, VPD, GDI, and GED-ICP-MS—including which approaches the industry will adopt more moving forward.

Ruth Merrifield, PhD, discusses how continuous manufacturing can help control contamination as humans don’t have to touch the materials as often, or even at all. Katsu Kawabata also mentions how automation that supports continuous manufacturing can help reduce human exposure to chemicals that would otherwise be manually handled.

Panelists discuss primary bottlenecks in semiconductor manufacturing, from geopolitical supply chain issues to purity and talent gaps, and explore strategies to maintain innovation under pressure.

In the first part of a three-part interview, Robert Ewing discusses the core technology behind the VaporID system, explains how the system differs from current IMS systems, and describes the challenges the team faced in miniaturizing the VaporID device into a portable, microwave-sized system.

Experts from across the industry prepare to explore the critical efficiency hurdles semiconductor fabricators are facing today, introducing themselves and their backgrounds.

In this edition of “Inside the Laboratory,” Brett McGuire of the Massachusetts Institute of Technology (MIT) discusses his laboratory’s work in astrochemistry.

In the lead-up to the International Symposium on Molecular Spectroscopy conference, Brett McGuire of the Massachusetts Institute of Technology sat down with Spectroscopy to preview the ISMS conference.

Top articles published this week include a tribute to Alan G. Marshall, an interview series that highlights how inductively coupled plasma–optical emission spectroscopy (ICP-OES) can help analyze metal content in pet food, and an announcement from Rigaku about their latest handheld Raman instruments.

In the final part of this video interview with Pooja Sheevam, she discusses the importance of her study in understanding the mineralogical and geochemical processes in Hawaii.

In Part IV of our conversation with Pooja Sheevam, she discusses how scanning electron microscopy with an energy-dispersive X-ray spectroscopy (SEM-EDS) and bulk X-ray fluorescence (XRF) were used to better understand fluid-rock interactions.

In Part III, our discussion with Pooja Sheevam focused on the use of long-wave IR (LWIR) spectroscopy in analyzing basaltic rocks.

In this interview segment, Pooja Sheevam elaborates on what LWIR and SWIR are and what advantages they both offer when analyzing Hawaiian geology.

In Part I of our video interview with Pooja Sheevam, she discusses why she and her team used both LWIR and SWIR spectroscopy in analyzing Hawaii's PTA-2 drill core, and how the two techniques complemented each other in the study.