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Standardized ISO Methodologies for the Assessment of Microplastics: An Update on Key Developments
March 10th 2023Webinar Date/Time: Europe: Tuesday, May 9, 2023, at 3pm BST | 4pm CEST North America: Tuesday, May 9, 2023, at 11am PDT | 2pm EDT Asia: Wednesday, May 10, 2023, at 8:30am IST | 11am HKT | 12pm JST | 1pm AEDT
Quality Compliance Facilitated by Your Forensic Information Management System
November 17th 2022Thursday, November 17, 2022 at 11am EDT | 10am CDT | 8am PDT No one in a forensic laboratory wants to hear “non-compliance.” Learn how you can you employ a Forensic Information Management System to achieve and maintain accreditation requirements.
Microplastics analysis just got easier: Analysis direct on-filter
November 16th 2022North America: Wednesday, November 16, 2022 at 11am PST | 1pm CST | 2pm EST Europe: Thursday, November 17, 2022, at 11am BST | 12pm CET Asia: Thursday, November 17, 2022, at 10:30 IST | 1pm SGT | 2pm JST | 4pm AEST Fast, easy, and accurate analysis of microplastics is a key need of anyone with an interest in this area. With the capacity to conduct this analysis directly on the filter in the Agilent 8700 LDIR for microplastics, this analysis has now reached a new level.
Hybrid Wafer Metrology for Bump Inspection and Overlay Control in Semiconductor Device Manufacturing
November 14th 2022Monday, November 14th, 2022 at 11am EST|8am PST|6pm IST Join us for this web seminar to learn about advanced hybrid metrology to optimize semiconductor R&D and high-volume manufacturing processes, including bump inspection in thin-film analysis, and thickness and composition measurements of AgSn micro solder bumps using a monochromatic micro X-ray beam.