
Special Issues
Interactive dedicated tools have been developed to facilitate the use of multiline analysis in inductively coupled plasma–atomic emission spectroscopy (ICP-AES) with emphases on multiline selection and on statistics for rejection of possible outliers. The aim is to take full benefit of the available information when using a charge-coupled device (CCD) detector–based instrument and to enhance the accuracy of the results. Determination of Cu in steel will be used to illustrate the potential of the tools.


















